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Applied Mathematics Colloquium


Friday, December 8, 2006, 11:30 am
Cullimore Lecture Hall II
New Jersey Institute of Technology

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Electromagnetic Imaging of Small Inhomogeneities




Michael Vogelius

Department of Mathematics

Rutgers University

New Brunswick, NJ






Abstract


I shall start by giving a brief survey of theoretical as well as practical (computational reconstruction-)results concerning the determination of small inhomogeneities from electromagnetic boundary data. Important tools are very precise asymptotic representation formulas for the field perturbations caused by small inhomogeneities. After a thorough discussion of such formulas and their derivation at zero and fixed, finite frequency I shall turn to discuss some very recent partial results that pertain to broad bands of (arbitrarily high) frequencies.